Author: "DAVID, RENE Title: Random Testing of Digital Circuits. Theory and Applications
Description: Spublisher, "1998. Marcel Dekker, New York, 1998. 475 pages, Paperback - former library book in good condition - Einband: "gebundene Bücher. 842
Keywords: "Technik
Price: EUR 12.00 = appr. US$ 13.04 Seller: Celler Versandantiquariat
- Book number: "2g4870