Author: "BHATTACHARYA, DEBASHIS/ HAYES, JOHN P.
Title: Hierarchical Modeling for VLSI Circuit Testing
Description: Spublisher, "1990. Kluwer, Boston, 1990. X, 159 pages with some graphics, hard cover -former library book in good condition- Einband: "gebundene Bücher. 460

Keywords: "Technik